True Color X-ray

Spectral photon-counting X-ray · HR-GaAs:Cr technology

Zeelta builds spectral X-ray technology on its own HR-GaAs:Cr semiconductor. The sensor counts every X-ray photon and measures its energy, so a single exposure shows both the structure of an object and its chemical composition.

Sensor material
HR-GaAs:Cr, room temperature
Pixel pitch
From 35 µm
DQE at 40 keV
Above 95%
Detection
Direct conversion, photon counting

Products

From sensor material to analysis

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Material
HR-GaAs:Cr“TOP” sensing material

HR-GaAs:Cr sensor material

High-resistivity gallium arsenide compensated with chromium. A room-temperature material for direct-conversion X-ray detectors.

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Sensor
HR-GaAs:Cr pixel sensor flip-chip bonded to a readout chip

X-ray sensors

Pixelated monolithic HR-GaAs:Cr sensors for spectral photon-counting detectors, prepared for flip-chip bonding to a readout chip.

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System
Spectral X-ray system prototype for luggage scanning

X-ray systems

Spectral X-ray systems for non-destructive testing and security screening, built on HR-GaAs:Cr detectors.

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Software
Spectral analysis of a surface crack in a turbine blade

Analytical software

Software for spectral image analysis in NDT: energy channels, element maps and AI-assisted composition analysis.

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Technology

X-ray goes from black and white to colour

Scintillator detectors have reached their physical limits. Direct photon counting adds a new dimension to every image: the energy of each photon.

Structure and chemistry in one scan

Energy-resolved counting shows the element composition of the object, not only its shape and density.

Higher spatial resolution

Resolution follows the pixel pitch, from 35 µm. Scintillator systems with a 110 µm pitch reach about 330 µm in practice.

Lower dose

Detective quantum efficiency above 90%, compared with 35 to 40% for a scintillator and photocell pair. Less harm to living specimens.

Finer density resolution

About 4,000 grey levels for each energy channel, independently. Routine radiography works with 256.

How it works

Applications

Who needs it

Medical diagnostics, security, material research, mining, radiation control and food quality control.

Industrial sample: hazardous inclusion in an aluminium alloy

Industrial NDT

Inclusions in aluminium alloys, cracks in turbine blades and defects in composites, found by element composition.

Spectral 3D X-ray image of a bone structure

Medical diagnostics

X-ray as functional diagnostic imaging: new methods for clinical research at lower dose.

Spectral luggage scanning prototype

Security

Luggage scanning prototype tested with the IATA standard test set to separate organic materials, metals and hazards.

News

Latest news

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Investors

Materials for investors and partners

Market, technology, competition, team and plans in one presentation. Zeelta is preparing a seed and Series A round.

Investor information

Contact

Write to us

Questions about HR-GaAs:Cr material, sensors, spectral X-ray systems, joint research or investment. We reply within one business day.

Direct contacts

Products, research and partnership
vvv@zeelta.com
Address
Zeelta Oy, Annankatu 25 LH 44, 00100 Helsinki, Finland

Or write to us directly: vvv@zeelta.com